From: Johan Hovold <jhovold@gmail.com>
Date: Thu, 21 Mar 2013 11:36:37 +0000 (+0100)
Subject: USB: usb_wwan: remove bogus disconnect test in close
X-Git-Url: https://git.stricted.de/?a=commitdiff_plain;h=e6d144bc27da921b81d46eb7cac461be59ae301b;p=GitHub%2FLineageOS%2Fandroid_kernel_samsung_universal7580.git

USB: usb_wwan: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
---

diff --git a/drivers/usb/serial/usb_wwan.c b/drivers/usb/serial/usb_wwan.c
index 571965aa1cc..ece326ef63a 100644
--- a/drivers/usb/serial/usb_wwan.c
+++ b/drivers/usb/serial/usb_wwan.c
@@ -421,20 +421,19 @@ void usb_wwan_close(struct usb_serial_port *port)
 
 	portdata = usb_get_serial_port_data(port);
 
-	if (serial->dev) {
-		/* Stop reading/writing urbs */
-		spin_lock_irq(&intfdata->susp_lock);
-		portdata->opened = 0;
-		spin_unlock_irq(&intfdata->susp_lock);
+	/* Stop reading/writing urbs */
+	spin_lock_irq(&intfdata->susp_lock);
+	portdata->opened = 0;
+	spin_unlock_irq(&intfdata->susp_lock);
 
-		for (i = 0; i < N_IN_URB; i++)
-			usb_kill_urb(portdata->in_urbs[i]);
-		for (i = 0; i < N_OUT_URB; i++)
-			usb_kill_urb(portdata->out_urbs[i]);
-		/* balancing - important as an error cannot be handled*/
-		usb_autopm_get_interface_no_resume(serial->interface);
-		serial->interface->needs_remote_wakeup = 0;
-	}
+	for (i = 0; i < N_IN_URB; i++)
+		usb_kill_urb(portdata->in_urbs[i]);
+	for (i = 0; i < N_OUT_URB; i++)
+		usb_kill_urb(portdata->out_urbs[i]);
+
+	/* balancing - important as an error cannot be handled*/
+	usb_autopm_get_interface_no_resume(serial->interface);
+	serial->interface->needs_remote_wakeup = 0;
 }
 EXPORT_SYMBOL(usb_wwan_close);