From: Bin Liu Date: Wed, 4 Jan 2017 00:13:47 +0000 (-0600) Subject: usb: musb: dsps: implement clear_ep_rxintr() callback X-Git-Url: https://git.stricted.de/?a=commitdiff_plain;h=c48400baa02155a5ddad63e8554602e48782278c;p=GitHub%2Fmoto-9609%2Fandroid_kernel_motorola_exynos9610.git usb: musb: dsps: implement clear_ep_rxintr() callback During dma teardown for dequque urb, if musb load is high, musb might generate bogus rx ep interrupt even when the rx fifo is flushed. In such case any of the follow log messages could happen. musb_host_rx 1853: BOGUS RX2 ready, csr 0000, count 0 musb_host_rx 1936: RX3 dma busy, csr 2020 As mentioned in the current inline comment, clearing ep interrupt in the teardown path avoids the bogus interrupt, so implement clear_ep_rxintr() callback. This bug seems to be existing since the initial driver for musb support, but I only validated the fix back to v4.1, so only cc stable for v4.1+. cc: stable@vger.kernel.org # 4.1+ Signed-off-by: Bin Liu Signed-off-by: Greg Kroah-Hartman --- diff --git a/drivers/usb/musb/musb_dsps.c b/drivers/usb/musb/musb_dsps.c index feae1561b9ab..9f125e179acd 100644 --- a/drivers/usb/musb/musb_dsps.c +++ b/drivers/usb/musb/musb_dsps.c @@ -267,6 +267,17 @@ static void otg_timer(unsigned long _musb) pm_runtime_put_autosuspend(dev); } +void dsps_musb_clear_ep_rxintr(struct musb *musb, int epnum) +{ + u32 epintr; + struct dsps_glue *glue = dev_get_drvdata(musb->controller->parent); + const struct dsps_musb_wrapper *wrp = glue->wrp; + + /* musb->lock might already been held */ + epintr = (1 << epnum) << wrp->rxep_shift; + musb_writel(musb->ctrl_base, wrp->epintr_status, epintr); +} + static irqreturn_t dsps_interrupt(int irq, void *hci) { struct musb *musb = hci; @@ -622,6 +633,7 @@ static struct musb_platform_ops dsps_ops = { .set_mode = dsps_musb_set_mode, .recover = dsps_musb_recover, + .clear_ep_rxintr = dsps_musb_clear_ep_rxintr, }; static u64 musb_dmamask = DMA_BIT_MASK(32);