From: Vladimir Murzin Date: Tue, 14 Apr 2015 22:48:40 +0000 (-0700) Subject: Kconfig: memtest: update number of test patterns up to 17 X-Git-Url: https://git.stricted.de/?a=commitdiff_plain;h=8d8cfb47d67ef38f49f97fc0cd3cfe2b5dc8642e;p=GitHub%2Fmoto-9609%2Fandroid_kernel_motorola_exynos9610.git Kconfig: memtest: update number of test patterns up to 17 Additional test patterns for memtest were introduced since commit 63823126c221 ("x86: memtest: add additional (regular) test patterns"), but looks like Kconfig was not updated that time. Update Kconfig entry with the actual number of maximum test patterns. Signed-off-by: Vladimir Murzin Cc: "H. Peter Anvin" Cc: Catalin Marinas Cc: Ingo Molnar Cc: Mark Rutland Cc: Russell King Cc: Thomas Gleixner Cc: Will Deacon Signed-off-by: Andrew Morton Signed-off-by: Linus Torvalds --- diff --git a/lib/Kconfig.debug b/lib/Kconfig.debug index 5c7a3183423b..15c9118f0389 100644 --- a/lib/Kconfig.debug +++ b/lib/Kconfig.debug @@ -1754,7 +1754,7 @@ config MEMTEST memtest=0, mean disabled; -- default memtest=1, mean do 1 test pattern; ... - memtest=4, mean do 4 test patterns. + memtest=17, mean do 17 test patterns. If you are unsure how to answer this question, answer N. source "samples/Kconfig"