From: Johan Hovold <jhovold@gmail.com>
Date: Thu, 21 Mar 2013 11:36:34 +0000 (+0100)
Subject: USB: keyspan_pda: remove bogus disconnect test in close
X-Git-Url: https://git.stricted.de/?a=commitdiff_plain;h=75d22b323fad49715068f74af9e65dbaba06614e;p=GitHub%2Fmoto-9609%2Fandroid_kernel_motorola_exynos9610.git

USB: keyspan_pda: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
---

diff --git a/drivers/usb/serial/keyspan_pda.c b/drivers/usb/serial/keyspan_pda.c
index 0d992ba7bd05..da3b29eb605c 100644
--- a/drivers/usb/serial/keyspan_pda.c
+++ b/drivers/usb/serial/keyspan_pda.c
@@ -649,13 +649,8 @@ error:
 }
 static void keyspan_pda_close(struct usb_serial_port *port)
 {
-	struct usb_serial *serial = port->serial;
-
-	if (serial->dev) {
-		/* shutdown our bulk reads and writes */
-		usb_kill_urb(port->write_urb);
-		usb_kill_urb(port->interrupt_in_urb);
-	}
+	usb_kill_urb(port->write_urb);
+	usb_kill_urb(port->interrupt_in_urb);
 }