From: Jesper Juhl Date: Mon, 11 Jul 2011 20:59:36 +0000 (+0200) Subject: USB: Remove test for NULL that'll never happen in usb_disconnect() X-Git-Url: https://git.stricted.de/?a=commitdiff_plain;h=316541bf70281b6c3b501b442b6994c1839776ad;p=GitHub%2Fexynos8895%2Fandroid_kernel_samsung_universal8895.git USB: Remove test for NULL that'll never happen in usb_disconnect() In drivers/usb/core/hub.c::usb_disconnect(), 'udev' will never be NULL, so remove the test and printing of debug message. Signed-off-by: Jesper Juhl Acked-by: Alan Stern Signed-off-by: Greg Kroah-Hartman --- diff --git a/drivers/usb/core/hub.c b/drivers/usb/core/hub.c index a428aa080a36..99fff6be3641 100644 --- a/drivers/usb/core/hub.c +++ b/drivers/usb/core/hub.c @@ -1636,11 +1636,6 @@ void usb_disconnect(struct usb_device **pdev) int i; struct usb_hcd *hcd = bus_to_hcd(udev->bus); - if (!udev) { - pr_debug ("%s nodev\n", __func__); - return; - } - /* mark the device as inactive, so any further urb submissions for * this device (and any of its children) will fail immediately. * this quiesces everything except pending urbs.