From: Jesper Juhl <jj@chaosbits.net>
Date: Mon, 11 Jul 2011 20:59:36 +0000 (+0200)
Subject: USB: Remove test for NULL that'll never happen in usb_disconnect()
X-Git-Url: https://git.stricted.de/?a=commitdiff_plain;h=316541bf70281b6c3b501b442b6994c1839776ad;p=GitHub%2Fexynos8895%2Fandroid_kernel_samsung_universal8895.git

USB: Remove test for NULL that'll never happen in usb_disconnect()

In drivers/usb/core/hub.c::usb_disconnect(), 'udev' will never be
NULL, so remove the test and printing of debug message.

Signed-off-by: Jesper Juhl <jj@chaosbits.net>
Acked-by: Alan Stern <stern@rowland.harvard.edu>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
---

diff --git a/drivers/usb/core/hub.c b/drivers/usb/core/hub.c
index a428aa080a36..99fff6be3641 100644
--- a/drivers/usb/core/hub.c
+++ b/drivers/usb/core/hub.c
@@ -1636,11 +1636,6 @@ void usb_disconnect(struct usb_device **pdev)
 	int			i;
 	struct usb_hcd		*hcd = bus_to_hcd(udev->bus);
 
-	if (!udev) {
-		pr_debug ("%s nodev\n", __func__);
-		return;
-	}
-
 	/* mark the device as inactive, so any further urb submissions for
 	 * this device (and any of its children) will fail immediately.
 	 * this quiesces everything except pending urbs.