uint64_t tdata_in : 8;
uint64_t ate_reset : 1;
} s;
- /**
- * struct cvmx_usbnx_usbp_ctl_status_cn30xx
- * @bist_done: PHY Bist Done.
- * Asserted at the end of the PHY BIST sequence.
- * @bist_err: PHY Bist Error.
- * Indicates an internal error was detected during
- * the BIST sequence.
- * @tdata_out: PHY Test Data Out.
- * Presents either internaly generated signals or
- * test register contents, based upon the value of
- * test_data_out_sel.
- * @dma_bmode: When set to 1 the L2C DMA address will be updated
- * with byte-counts between packets. When set to 0
- * the L2C DMA address is incremented to the next
- * 4-byte aligned address after adding byte-count.
- * @usbc_end: Bigendian input to the USB Core. This should be
- * set to '0' for operation.
- * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP.
- * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP.
- * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY.
- * This signal enables the pull-down resistance on
- * the D+ line. '1' pull down-resistance is connected
- * to D+/ '0' pull down resistance is not connected
- * to D+. When an A/B device is acting as a host
- * (downstream-facing port), dp_pulldown and
- * dm_pulldown are enabled. This must not toggle
- * during normal opeartion.
- * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY.
- * This signal enables the pull-down resistance on
- * the D- line. '1' pull down-resistance is connected
- * to D-. '0' pull down resistance is not connected
- * to D-. When an A/B device is acting as a host
- * (downstream-facing port), dp_pulldown and
- * dm_pulldown are enabled. This must not toggle
- * during normal opeartion.
- * @hst_mode: When '0' the USB is acting as HOST, when '1'
- * USB is acting as device. This field needs to be
- * set while the USB is in reset.
- * @tuning: Transmitter Tuning for High-Speed Operation.
- * Tunes the current supply and rise/fall output
- * times for high-speed operation.
- * [20:19] == 11: Current supply increased
- * approximately 9%
- * [20:19] == 10: Current supply increased
- * approximately 4.5%
- * [20:19] == 01: Design default.
- * [20:19] == 00: Current supply decreased
- * approximately 4.5%
- * [22:21] == 11: Rise and fall times are increased.
- * [22:21] == 10: Design default.
- * [22:21] == 01: Rise and fall times are decreased.
- * [22:21] == 00: Rise and fall times are decreased
- * further as compared to the 01 setting.
- * @tx_bs_enh: Transmit Bit Stuffing on [15:8].
- * Enables or disables bit stuffing on data[15:8]
- * when bit-stuffing is enabled.
- * @tx_bs_en: Transmit Bit Stuffing on [7:0].
- * Enables or disables bit stuffing on data[7:0]
- * when bit-stuffing is enabled.
- * @loop_enb: PHY Loopback Test Enable.
- * '1': During data transmission the receive is
- * enabled.
- * '0': During data transmission the receive is
- * disabled.
- * Must be '0' for normal operation.
- * @vtest_enb: Analog Test Pin Enable.
- * '1' The PHY's analog_test pin is enabled for the
- * input and output of applicable analog test signals.
- * '0' THe analog_test pin is disabled.
- * @bist_enb: Built-In Self Test Enable.
- * Used to activate BIST in the PHY.
- * @tdata_sel: Test Data Out Select.
- * '1' test_data_out[3:0] (PHY) register contents
- * are output. '0' internaly generated signals are
- * output.
- * @taddr_in: Mode Address for Test Interface.
- * Specifies the register address for writing to or
- * reading from the PHY test interface register.
- * @tdata_in: Internal Testing Register Input Data and Select
- * This is a test bus. Data is present on [3:0],
- * and its corresponding select (enable) is present
- * on bits [7:4].
- * @ate_reset: Reset input from automatic test equipment.
- * This is a test signal. When the USB Core is
- * powered up (not in Susned Mode), an automatic
- * tester can use this to disable phy_clock and
- * free_clk, then re-eanable them with an aligned
- * phase.
- * '1': The phy_clk and free_clk outputs are
- * disabled. "0": The phy_clock and free_clk outputs
- * are available within a specific period after the
- * de-assertion.
- */
- struct cvmx_usbnx_usbp_ctl_status_cn30xx {
- uint64_t reserved_38_63 : 26;
- uint64_t bist_done : 1;
- uint64_t bist_err : 1;
- uint64_t tdata_out : 4;
- uint64_t reserved_30_31 : 2;
- uint64_t dma_bmode : 1;
- uint64_t usbc_end : 1;
- uint64_t usbp_bist : 1;
- uint64_t tclk : 1;
- uint64_t dp_pulld : 1;
- uint64_t dm_pulld : 1;
- uint64_t hst_mode : 1;
- uint64_t tuning : 4;
- uint64_t tx_bs_enh : 1;
- uint64_t tx_bs_en : 1;
- uint64_t loop_enb : 1;
- uint64_t vtest_enb : 1;
- uint64_t bist_enb : 1;
- uint64_t tdata_sel : 1;
- uint64_t taddr_in : 4;
- uint64_t tdata_in : 8;
- uint64_t ate_reset : 1;
- } cn30xx;
- /**
- * struct cvmx_usbnx_usbp_ctl_status_cn50xx
- * @txrisetune: HS Transmitter Rise/Fall Time Adjustment
- * @txvreftune: HS DC Voltage Level Adjustment
- * @txfslstune: FS/LS Source Impedence Adjustment
- * @txhsxvtune: Transmitter High-Speed Crossover Adjustment
- * @sqrxtune: Squelch Threshold Adjustment
- * @compdistune: Disconnect Threshold Adjustment
- * @otgtune: VBUS Valid Threshold Adjustment
- * @otgdisable: OTG Block Disable
- * @portreset: Per_Port Reset
- * @drvvbus: Drive VBUS
- * @lsbist: Low-Speed BIST Enable.
- * @fsbist: Full-Speed BIST Enable.
- * @hsbist: High-Speed BIST Enable.
- * @bist_done: PHY Bist Done.
- * Asserted at the end of the PHY BIST sequence.
- * @bist_err: PHY Bist Error.
- * Indicates an internal error was detected during
- * the BIST sequence.
- * @tdata_out: PHY Test Data Out.
- * Presents either internaly generated signals or
- * test register contents, based upon the value of
- * test_data_out_sel.
- * @txpreemphasistune: HS Transmitter Pre-Emphasis Enable
- * @dma_bmode: When set to 1 the L2C DMA address will be updated
- * with byte-counts between packets. When set to 0
- * the L2C DMA address is incremented to the next
- * 4-byte aligned address after adding byte-count.
- * @usbc_end: Bigendian input to the USB Core. This should be
- * set to '0' for operation.
- * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP.
- * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP.
- * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY.
- * This signal enables the pull-down resistance on
- * the D+ line. '1' pull down-resistance is connected
- * to D+/ '0' pull down resistance is not connected
- * to D+. When an A/B device is acting as a host
- * (downstream-facing port), dp_pulldown and
- * dm_pulldown are enabled. This must not toggle
- * during normal opeartion.
- * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY.
- * This signal enables the pull-down resistance on
- * the D- line. '1' pull down-resistance is connected
- * to D-. '0' pull down resistance is not connected
- * to D-. When an A/B device is acting as a host
- * (downstream-facing port), dp_pulldown and
- * dm_pulldown are enabled. This must not toggle
- * during normal opeartion.
- * @hst_mode: When '0' the USB is acting as HOST, when '1'
- * USB is acting as device. This field needs to be
- * set while the USB is in reset.
- * @tx_bs_enh: Transmit Bit Stuffing on [15:8].
- * Enables or disables bit stuffing on data[15:8]
- * when bit-stuffing is enabled.
- * @tx_bs_en: Transmit Bit Stuffing on [7:0].
- * Enables or disables bit stuffing on data[7:0]
- * when bit-stuffing is enabled.
- * @loop_enb: PHY Loopback Test Enable.
- * '1': During data transmission the receive is
- * enabled.
- * '0': During data transmission the receive is
- * disabled.
- * Must be '0' for normal operation.
- * @vtest_enb: Analog Test Pin Enable.
- * '1' The PHY's analog_test pin is enabled for the
- * input and output of applicable analog test signals.
- * '0' THe analog_test pin is disabled.
- * @bist_enb: Built-In Self Test Enable.
- * Used to activate BIST in the PHY.
- * @tdata_sel: Test Data Out Select.
- * '1' test_data_out[3:0] (PHY) register contents
- * are output. '0' internaly generated signals are
- * output.
- * @taddr_in: Mode Address for Test Interface.
- * Specifies the register address for writing to or
- * reading from the PHY test interface register.
- * @tdata_in: Internal Testing Register Input Data and Select
- * This is a test bus. Data is present on [3:0],
- * and its corresponding select (enable) is present
- * on bits [7:4].
- * @ate_reset: Reset input from automatic test equipment.
- * This is a test signal. When the USB Core is
- * powered up (not in Susned Mode), an automatic
- * tester can use this to disable phy_clock and
- * free_clk, then re-eanable them with an aligned
- * phase.
- * '1': The phy_clk and free_clk outputs are
- * disabled. "0": The phy_clock and free_clk outputs
- * are available within a specific period after the
- * de-assertion.
- */
- struct cvmx_usbnx_usbp_ctl_status_cn50xx {
- uint64_t txrisetune : 1;
- uint64_t txvreftune : 4;
- uint64_t txfslstune : 4;
- uint64_t txhsxvtune : 2;
- uint64_t sqrxtune : 3;
- uint64_t compdistune : 3;
- uint64_t otgtune : 3;
- uint64_t otgdisable : 1;
- uint64_t portreset : 1;
- uint64_t drvvbus : 1;
- uint64_t lsbist : 1;
- uint64_t fsbist : 1;
- uint64_t hsbist : 1;
- uint64_t bist_done : 1;
- uint64_t bist_err : 1;
- uint64_t tdata_out : 4;
- uint64_t reserved_31_31 : 1;
- uint64_t txpreemphasistune : 1;
- uint64_t dma_bmode : 1;
- uint64_t usbc_end : 1;
- uint64_t usbp_bist : 1;
- uint64_t tclk : 1;
- uint64_t dp_pulld : 1;
- uint64_t dm_pulld : 1;
- uint64_t hst_mode : 1;
- uint64_t reserved_19_22 : 4;
- uint64_t tx_bs_enh : 1;
- uint64_t tx_bs_en : 1;
- uint64_t loop_enb : 1;
- uint64_t vtest_enb : 1;
- uint64_t bist_enb : 1;
- uint64_t tdata_sel : 1;
- uint64_t taddr_in : 4;
- uint64_t tdata_in : 8;
- uint64_t ate_reset : 1;
- } cn50xx;
- /**
- * struct cvmx_usbnx_usbp_ctl_status_cn52xx
- * @txrisetune: HS Transmitter Rise/Fall Time Adjustment
- * @txvreftune: HS DC Voltage Level Adjustment
- * @txfslstune: FS/LS Source Impedence Adjustment
- * @txhsxvtune: Transmitter High-Speed Crossover Adjustment
- * @sqrxtune: Squelch Threshold Adjustment
- * @compdistune: Disconnect Threshold Adjustment
- * @otgtune: VBUS Valid Threshold Adjustment
- * @otgdisable: OTG Block Disable
- * @portreset: Per_Port Reset
- * @drvvbus: Drive VBUS
- * @lsbist: Low-Speed BIST Enable.
- * @fsbist: Full-Speed BIST Enable.
- * @hsbist: High-Speed BIST Enable.
- * @bist_done: PHY Bist Done.
- * Asserted at the end of the PHY BIST sequence.
- * @bist_err: PHY Bist Error.
- * Indicates an internal error was detected during
- * the BIST sequence.
- * @tdata_out: PHY Test Data Out.
- * Presents either internaly generated signals or
- * test register contents, based upon the value of
- * test_data_out_sel.
- * @siddq: Drives the USBP (USB-PHY) SIDDQ input.
- * Normally should be set to zero.
- * When customers have no intent to use USB PHY
- * interface, they should:
- * - still provide 3.3V to USB_VDD33, and
- * - tie USB_REXT to 3.3V supply, and
- * - set USBN*_USBP_CTL_STATUS[SIDDQ]=1
- * @txpreemphasistune: HS Transmitter Pre-Emphasis Enable
- * @dma_bmode: When set to 1 the L2C DMA address will be updated
- * with byte-counts between packets. When set to 0
- * the L2C DMA address is incremented to the next
- * 4-byte aligned address after adding byte-count.
- * @usbc_end: Bigendian input to the USB Core. This should be
- * set to '0' for operation.
- * @usbp_bist: PHY, This is cleared '0' to run BIST on the USBP.
- * @tclk: PHY Test Clock, used to load TDATA_IN to the USBP.
- * @dp_pulld: PHY DP_PULLDOWN input to the USB-PHY.
- * This signal enables the pull-down resistance on
- * the D+ line. '1' pull down-resistance is connected
- * to D+/ '0' pull down resistance is not connected
- * to D+. When an A/B device is acting as a host
- * (downstream-facing port), dp_pulldown and
- * dm_pulldown are enabled. This must not toggle
- * during normal opeartion.
- * @dm_pulld: PHY DM_PULLDOWN input to the USB-PHY.
- * This signal enables the pull-down resistance on
- * the D- line. '1' pull down-resistance is connected
- * to D-. '0' pull down resistance is not connected
- * to D-. When an A/B device is acting as a host
- * (downstream-facing port), dp_pulldown and
- * dm_pulldown are enabled. This must not toggle
- * during normal opeartion.
- * @hst_mode: When '0' the USB is acting as HOST, when '1'
- * USB is acting as device. This field needs to be
- * set while the USB is in reset.
- * @tx_bs_enh: Transmit Bit Stuffing on [15:8].
- * Enables or disables bit stuffing on data[15:8]
- * when bit-stuffing is enabled.
- * @tx_bs_en: Transmit Bit Stuffing on [7:0].
- * Enables or disables bit stuffing on data[7:0]
- * when bit-stuffing is enabled.
- * @loop_enb: PHY Loopback Test Enable.
- * '1': During data transmission the receive is
- * enabled.
- * '0': During data transmission the receive is
- * disabled.
- * Must be '0' for normal operation.
- * @vtest_enb: Analog Test Pin Enable.
- * '1' The PHY's analog_test pin is enabled for the
- * input and output of applicable analog test signals.
- * '0' THe analog_test pin is disabled.
- * @bist_enb: Built-In Self Test Enable.
- * Used to activate BIST in the PHY.
- * @tdata_sel: Test Data Out Select.
- * '1' test_data_out[3:0] (PHY) register contents
- * are output. '0' internaly generated signals are
- * output.
- * @taddr_in: Mode Address for Test Interface.
- * Specifies the register address for writing to or
- * reading from the PHY test interface register.
- * @tdata_in: Internal Testing Register Input Data and Select
- * This is a test bus. Data is present on [3:0],
- * and its corresponding select (enable) is present
- * on bits [7:4].
- * @ate_reset: Reset input from automatic test equipment.
- * This is a test signal. When the USB Core is
- * powered up (not in Susned Mode), an automatic
- * tester can use this to disable phy_clock and
- * free_clk, then re-eanable them with an aligned
- * phase.
- * '1': The phy_clk and free_clk outputs are
- * disabled. "0": The phy_clock and free_clk outputs
- * are available within a specific period after the
- * de-assertion.
- */
- struct cvmx_usbnx_usbp_ctl_status_cn52xx {
- uint64_t txrisetune : 1;
- uint64_t txvreftune : 4;
- uint64_t txfslstune : 4;
- uint64_t txhsxvtune : 2;
- uint64_t sqrxtune : 3;
- uint64_t compdistune : 3;
- uint64_t otgtune : 3;
- uint64_t otgdisable : 1;
- uint64_t portreset : 1;
- uint64_t drvvbus : 1;
- uint64_t lsbist : 1;
- uint64_t fsbist : 1;
- uint64_t hsbist : 1;
- uint64_t bist_done : 1;
- uint64_t bist_err : 1;
- uint64_t tdata_out : 4;
- uint64_t siddq : 1;
- uint64_t txpreemphasistune : 1;
- uint64_t dma_bmode : 1;
- uint64_t usbc_end : 1;
- uint64_t usbp_bist : 1;
- uint64_t tclk : 1;
- uint64_t dp_pulld : 1;
- uint64_t dm_pulld : 1;
- uint64_t hst_mode : 1;
- uint64_t reserved_19_22 : 4;
- uint64_t tx_bs_enh : 1;
- uint64_t tx_bs_en : 1;
- uint64_t loop_enb : 1;
- uint64_t vtest_enb : 1;
- uint64_t bist_enb : 1;
- uint64_t tdata_sel : 1;
- uint64_t taddr_in : 4;
- uint64_t tdata_in : 8;
- uint64_t ate_reset : 1;
- } cn52xx;
};
#endif
projects / GitHub / MotorolaMobilityLLC / kernel-slsi.git / commitdiff