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(parent: 8a27a02) | patch
staging:iio: rip out scan_el attributes. Now handled as iio_dev_attrs like everything...
authorJonathan Cameron <jic23@cam.ac.uk>
Wed, 18 May 2011 13:42:08 +0000 (14:42 +0100)
committerGreg Kroah-Hartman <gregkh@suse.de>
Thu, 19 May 2011 23:14:59 +0000 (16:14 -0700)
commita88b3ebc91e4606490fe0dd980ec9134cb816f42
tree804f820826f60ba03143b0c2148c3e8e45ee0e66tree | snapshot (tar.gz zip)
parent8a27a023f8f66a8361c5e3d8160a690f480479eccommit | diff
staging:iio: rip out scan_el attributes. Now handled as iio_dev_attrs like everything else.

Drivers have no need to use this functionality any more and we save a lot of
code by getting rid of it.

Signed-off-by: Jonathan Cameron <jic23@cam.ac.uk>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
drivers/staging/iio/industrialio-ring.c diff | blob | blame | history
drivers/staging/iio/ring_generic.h diff | blob | blame | history