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(parent: be26f9a) | patch
nfit, tools/testing/nvdimm: test multiple control regions per-dimm
authorDan Williams <dan.j.williams@intel.com>
Tue, 2 Feb 2016 01:45:54 +0000 (17:45 -0800)
committerDan Williams <dan.j.williams@intel.com>
Sat, 5 Mar 2016 20:24:06 +0000 (12:24 -0800)
commit3b87356f50aa12ae7f9bd60f630eb17fe9b4b253
tree9f469e4e7828dfec77496567a0b8d689e46dd251tree | snapshot (tar.gz zip)
parentbe26f9ae022ad09967be7a83c58ce605014e939acommit | diff
nfit, tools/testing/nvdimm: test multiple control regions per-dimm

ACPI 6.1 clarifies that "The system shall include an NVDIMM Control
Region Structure for every Function Interface in the NVDIMM."
Implement this clarification in nfit_test.

Signed-off-by: Dan Williams <dan.j.williams@intel.com>
tools/testing/nvdimm/test/nfit.c diff | blob | blame | history