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[MTD] NAND: Fix broken bad block scan for 16 bit devices
authorThomas Gleixner <tglx@linutronix.de>
Fri, 15 Jul 2005 13:53:51 +0000 (14:53 +0100)
committerThomas Gleixner <tglx@mtd.linutronix.de>
Sat, 16 Jul 2005 07:27:52 +0000 (09:27 +0200)
commit19870da7ea2fc483bf73a189046a430fd9b01391
tree3f8d07e75dc9895c52c2184d28e3c43a84b0234btree | snapshot (tar.gz zip)
parent2c4eec9802ae753a4973f0a0d71f8d154e86fd31commit | diff
[MTD] NAND: Fix broken bad block scan for 16 bit devices

The previous change to read a single byte from oob breaks the
bad block scan on 16 bit devices, when the byte is on an odd
address. Read the complete oob for now.
Remove the unused arguments from check_short_pattern()
Move the wait for ready function so it is only executed when
consecutive reads happen.

Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
drivers/mtd/nand/nand_base.c diff | blob | blame | history
drivers/mtd/nand/nand_bbt.c diff | blob | blame | history