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USB: EHCI: remove useless test
authorAlan Stern <stern@rowland.harvard.edu>
Wed, 19 Sep 2012 21:00:55 +0000 (17:00 -0400)
committerGreg Kroah-Hartman <gregkh@linuxfoundation.org>
Fri, 21 Sep 2012 16:37:53 +0000 (09:37 -0700)
commit17dcfc9bd3dfb699e00205ec9d431b5a5cb00b34
tree6ace671b30fd7fd6b1bd3a7aa5b43a37920d3099tree | snapshot (tar.gz zip)
parent0cb72e184ac4d83705147eee07ba978473b75015commit | diff
USB: EHCI: remove useless test

This patch (as1605) removes a useless test from the EHCI debugfs
code.  There's no point checking whether p.qh is non-NULL; we already
know it is and in any case it gets dereferenced aerlier in the
function.

The useless test was identified by smatch.

Signed-off-by: Alan Stern <stern@rowland.harvard.edu>
Reported-by: Fengguang Wu <fengguang.wu@intel.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
drivers/usb/host/ehci-dbg.c diff | blob | blame | history
kernel source for telekom puls (alcatel/mediatek)